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High-pressure x-ray diffraction and Raman spectroscopy of Hf V 2 O 7

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https://hal-univ-tln.archives-ouvertes.fr/hal-01727428
Contributor : Christine Leroux <>
Submitted on : Friday, March 9, 2018 - 10:48:12 AM
Last modification on : Wednesday, July 15, 2020 - 9:42:03 AM

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U. Hemamala, F. El-Ghussein, M. Goedken, B. Chen, Christine Leroux, et al.. High-pressure x-ray diffraction and Raman spectroscopy of Hf V 2 O 7. Physical Review B: Condensed Matter and Materials Physics, American Physical Society, 2004, 70 (21), ⟨10.1103/PhysRevB.70.214114⟩. ⟨hal-01727428⟩

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