High-pressure x-ray diffraction and Raman spectroscopy of Hf V 2 O 7

U. Hemamala; F. El-Ghussein; M. Goedken; B. Chen; Christine Leroux; M. Krüger

doi:10.1103/PhysRevB.70.214114

Journal Articles Physical Review B: Condensed Matter and Materials Physics (1998-2015) Year : 2004

High-pressure x-ray diffraction and Raman spectroscopy of Hf V 2 O 7

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U. Hemamala

Function : Author

F. El-Ghussein

Function : Author

M. Goedken

Function : Author

B. Chen

Function : Author

LInguistique et DIdactique des Langues Étrangères et Maternelles

Christine Leroux

Function : Author
PersonId : 608
IdHAL : chl
ORCID : 0000-0003-4649-9305
IdRef : 115565329

Institut des Matériaux, de Microélectronique et des Nanosciences de Provence

CV

M. Krüger

Function : Author

Max Planck Institute for Intelligent Systems [Tübingen]

Domains

Materials Science [cond-mat.mtrl-sci]

Christine Leroux : Connect in order to contact the contributor

https://hal-univ-tln.archives-ouvertes.fr/hal-01727428

Submitted on : Friday, March 9, 2018-10:48:12 AM

Last modification on : Friday, March 24, 2023-2:53:06 PM

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hal-01727428 , version 1 (09-03-2018)

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HAL Id : hal-01727428 , version 1
DOI : 10.1103/PhysRevB.70.214114

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U. Hemamala, F. El-Ghussein, M. Goedken, B. Chen, Christine Leroux, et al.. High-pressure x-ray diffraction and Raman spectroscopy of Hf V 2 O 7. Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2004, 70 (21), ⟨10.1103/PhysRevB.70.214114⟩. ⟨hal-01727428⟩

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High-pressure x-ray diffraction and Raman spectroscopy of Hf V 2 O 7

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