Crystal structure of oligothiophene thin films characterized by two-dimensional grazing incidence X-ray diffraction

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Submitted on : Monday, September 12, 2016 - 3:19:08 PM
Last modification on : Wednesday, February 27, 2019 - 4:12:04 PM

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Takeshi Watanabe, Tomoyuki Koganezawa, Mamoru Kikuchi, Christine Videlot-Ackermann, Jörg Ackermann, et al.. Crystal structure of oligothiophene thin films characterized by two-dimensional grazing incidence X-ray diffraction. Japanese Journal of Applied Physics, part 1 : Regular papers, Short Notes, 2014, 53 (1S), pp.01AD01. ⟨10.7567/JJAP.53.01AD01⟩. ⟨hal-01364372⟩

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